This paper presents a new end-to-end semi-supervised framework to learn a dense keypoint detector using unlabeled multiview images. A key challenge lies in finding the exact correspondences between the dense keypoints in multiple views since the inverse of the keypoint mapping can be neither analytically derived nor differentiated. This limits applying existing multiview supervision approaches used to learn sparse keypoints that rely on the exact correspondences. To address this challenge, we derive a new probabilistic epipolar constraint that encodes the two desired properties.

This paper presents a new end-to-end semi-supervised framework to learn a dense keypoint detector using unlabeled multiview images. A key challenge lies in finding the exact correspondences between the dense keypoints in multiple views since the inverse of the keypoint mapping can be neither analytically derived nor differentiated. This limits applying existing multiview supervision approaches used to learn sparse keypoints that rely on the exact correspondences. To address this challenge, we derive a new probabilistic epipolar constraint that encodes the two desired properties. We formulate a probabilistic epipolar constraint using a weighted average of epipolar errors through the matchability thereby generalizing the point-to-point geometric error to the field-to-field geometric error.